Publication
Development of SCAR Markers Linked to Common Bacterial Blight Resistance Genes (QTL) in Common Bean
Details
Author(s):
G. Jung; S. Beebe; J. Nienhuis; S. Park; D. Coyne; J. Marita; F. Pedraza; J. Tohme
Type of Document:
Research Report
Publisher/Journal:
Annual Report of the Bean Improvement Cooperative
Date of Publication:
1998
Place of Publication:
Not Available
Description
Coming soon