Molecular Marker-Based Genetic Analysis of Tepary Bean-Derived Common Bacterial Blight Resistance in Different Developmental Stages of Common Bean

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Details

Author(s):
G. Jung; P. W. Skroch; D. P. Coyne; J. Nienhuis; E. Arnaud-Santanta; H. M. Ariyarathne; S. M. Kaeppler; M. J. Bassett

Type of Document:
Scholarly Article

 

Publisher/Journal:
Journal of the American Society for Horticultural Science

Date of Publication:
1997

Place of Publication:
Not Available

Description

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Additional Bibliographic Information

Jung, G., P. W. Skroch, D. P. Coyne, J. Nienhuis, E. Arnaud-Santanta, H. M. Ariyarathne, S. M. Kaeppler and M. J. Bassett. 1997. Molecular Marker-Based Genetic Analysis of Tepary Bean-Derived Common Bacterial Blight Resistance in Different Developmental Stages of Common Bean. Journal of the American Society for Horticultural Science 122:329-337.

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