Backcross Breeding with RAPD Molecular Markers to Enhance Resistance to Common Bacterial Blight in Pinto Beans

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Details

Author(s):
N. Mutlu; D. P. Coyne; S. O. Park; J. R. Steadman

Type of Document:
Scholarly Article

 

Publisher/Journal:
HortScience

Date of Publication:
1999

Place of Publication:
Not Available

Description

Coming soon

Additional Bibliographic Information

Mutlu, N., D. P. Coyne, S. O. Park and J. R. Steadman. 1999. Backcross Breeding with RAPD Molecular Markers to Enhance Resistance to Common Bacterial Blight in Pinto Beans. HortScience 34:453.

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