Identifying Randomly Amplified Polymorphic DNA (RAPD) Markers Linked to Major Genes for Common Bacterial Blight Resistance in Tepary Bean

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Details

Author(s):
S.O. Park; D. P. Coyne; A. Dursun; G. Jung

Type of Document:
Scholarly Article

 

Publisher/Journal:
Journal of the American Society for Horticultural Science

Date of Publication:
1998

Place of Publication:
Not Available

Description

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Additional Bibliographic Information

Park, S. O., D. P. Coyne, A. Dursun and G. Jung. 1998. Identifying Randomly Amplified Polymorphic DNA (RAPD) Markers Linked to Major Genes for Common Bacterial Blight Resistance in Tepary Bean. Journal of the American Society for Horticultural Science 123:278-282.

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