Development of SCAR Markers Linked to Common Bacterial Blight Resistance Genes (QTL) in Common Bean

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Details

Author(s):
G. Jung; S. Beebe; J. Nienhuis; S. Park; D. Coyne; J. Marita; F. Pedraza; J. Tohme

Type of Document:
Research Report

 

Publisher/Journal:
Annual Report of the Bean Improvement Cooperative

Date of Publication:
1998

Place of Publication:
Not Available

Description

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Additional Bibliographic Information

Jung, G., S. Beebe, J. Nienhuis, S. Park, D. Coyne, J. Marita, F. Pedraza and J. Tohme. 1998. Development of SCAR Markers Linked to Common Bacterial Blight Resistance Genes (QTL) in Common Bean. Annual Report of the Bean Improvement Cooperative 41:97-98.

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