Publication
Backcross breeding and RAPD Molecular Markers to Enhance Resistance to Common Bacterial Blight of Pinto Beans
Details
Author(s):
N. Mutlu; D. P. Coyne; S. O. Park; J. R. Steadman; J. Reiser; G. Jung
Type of Document:
Research Report
Publisher/Journal:
Annual Report of the Bean Improvement Cooperative
Date of Publication:
1999
Place of Publication:
Not Available
Description
Coming soon
