Mapping Molecular Markers and Seed Coat Pattern Associated with QTL Affecting White Mold Resistance in Common Bean

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Details

Author(s):
S.O. Park; D. P. Coyne; J. R. Steadman; G. Jung

Type of Document:
Research Report

 

Publisher/Journal:
Annual Report of the Bean Improvement Cooperative

Date of Publication:
1999

Place of Publication:
Not Available

Description

Coming soon

Additional Bibliographic Information

Park, S. O., D. P. Coyne, J. R. Steadman and G. Jung. 1999. Mapping Molecular Markers and Seed Coat Pattern Associated with QTL Affecting White Mold Resistance in Common Bean. Annual Report of the Bean Improvement Cooperative 42:45-46.

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